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New metric describes edge noise in bilevel images

New metric describes edge noise in bilevel images

Image of Elisa Barney SmithOctober 21, 2009 – An article by Elisa Barney Smith in the Department of Electrical and Computer Engineering was posted Oct. 13 in the online newsroom of SPIE, an international society for optics and photonics that advances light-based technologies and serves more than 188,000 constituents from 138 countries. The article, “New metric describes edge noise in bilevel images,” addresses a new approach that enables quantitative and qualitative characterization of varying edge noise in images even if the additive noise level is constant.

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