Skip to Main Content
Mobile Menu

Bruker DektakXT Stylus Profilometer

Photo courtesy of Bruker

Manufacturer: Bruker
Model: DektakXT

Description: The Bruker DektakXT stylus profilometer can be used for measuring step heights and surface features of thin films. The tool is capable of measuring data in the range of approximately 10 nm to 1 mm. Larger area surface mapping scans can also be completed on the Bruker.