SPM Systems and Nanofabrication Laboratory
Scanning Probe Microscope (SPM) Systems:
- Digital Instruments (Veeco Metrology Group) Dimension 3100 SPM with a Nanoscope V controller
- Digital Instruments (Veeco Metrology Group) MultiMode SPM with a PicoForce system and Nanoscope IV controller
- Hybrid X-Y-Z Closed Loop Scanner
- Hysitron TS 70 Triboscope - Nanomechanical/Nanoindentation System
Capabilities:
SPM Research Engineer:
- Jason Brotherton (MSE UG, Sum 2006)
- Jonathan Henderson (ME UG, Sum 2006)
- Matt Reinhold (MSE UG, Sum 2006)
- Ross Butler (UG, ECE)
- TyRee Lee (ECE UG, Fall 2007)
- Amber Cox (MSE UG, Spring 2008)
- William "Mac" McNeil (MSE Grad, Sum 2008)
Collaborations and Users:
Funded in Part by:
Webmaster: Michael Ogas and Richard Southwick, Last updated May 25, 2006
