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Justin Reed

Undergraduate Research Assistant

Department of Electrical and Computer Engineering

Justin has been a member of the group since Summer 2006. He graduates in December 2009 with a emphasis in semiconductors and Mandarin Chinese and is looking forward to starting graduate school.

Justin is currently investigating polaron hopping conduction in HfO₂, specifically found in MOSFET devices, and working in a collaboration with Oregon State and Penn State studying Non-Volatile Memory Trap Based Flash.

Justin has presented a poster titled, "Experimental Evidence for Polaron Hopping Conduction in HfO₂ - A Cryogenic Study" at the 2008 IEEE Integrated Reliability Workshop and has co-authored a few other posters and papers.