Device and IC Characterization Lab
Equipment
Agilent Characterization System
- Agilent 4156C Precision Semiconductor Parameter Analyzer w/Quasi Static CV (view)
- Agilent 41501B SMU and Pulse Generator Unit - 500kHz dual pulse generators for pulse voltage stressing and charge pumping measurements (view)
- Agilent 16440A SMU/Pulse Generator Selector
- Agilent E5250A Low Leakage Switch Matrix (view)
- HP 4284A LCR meter (view)
- Metrics Technology Interactive Characterization Software (Controls 4156C system for automation!) (view)
- Agilent E3662B Rack Cabinet - Modularizes the Agilent Characterization System (view)
Keithly Characterization Systems
- 2-Keithley 4200 Semiconductor Characterization System - 4 source measurement units and 4 pre-amps with 0.1 femtoampere current resolution (view)
- Keithley 595 Quasistatic CV Meter (view)
- 2 HP 4284A LCR meter (view)
- 2 Keithley 707A Ultra Low Current-High Frequency Solid State Switching matrix (3-8X24 I/O cards) (view)
Variable Temperature Probe Station
More info coming soon!
Low Noise Spectroscopy Station
- 1 DC Battery Powered Source
- 1 Yokogawa 765101-A-3/D Programmable DC Voltage/Current Source with Front Output Terminal and GPIB, 115/100 V AC, UL Standard
- 1 Hewlett Packard 34401A Multimeter
- 1 Pomona Shielded Housing for 100 K Resistors
- 1 Stanford Research SR560 Low Noise Preamplifier
- 1 Hewlett Packard (HP) 35665A Dynamic Signal Analyzer (DSA)
- 8 Cascade Microtech DCP Coaxial Probes and Mount
Additional Equipment
- 3-Micromanipulator Probe Stations & Faraday Cages (view)
- One altered station to accommodate through wafer interconnects
- 24 Cascade Microtech DCM-Series MicroManipulators
- Several Agilent 16495F Connector Plates
- Agilent 81110A Pulse/Pattern Generator Unit (2 channels - frequency range up to 330MHz)*
- Agilent Infiniium 54832D 1GHz 4 channel 4GSamples/s Mixed Signal Oscilloscope with Windows XP Interface
Keithley Training
Other Keithley Resources
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