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Instrumentation

JEOL JEM-2100 HR Analytical Transmission Electron Microscope (TEM)
Image of Transmission Electron Microscope (TEM)CCD camera (Orius SC1000, Gatan)
Point resolution 0.23 nm
Line resolution 0.14 nm
STEM resolution 1.0 nm
EDS chemical analysis (Noran System 7, Thermo Scientific)
EELS chemical analysis, (Model 776 Enfina 1000, Gatan)
In-column annular dark field detector
Tomography unit for reconstruction of 3D images
In situ heating up to 1273 K (Gatan 652 double-tilt heating holder)
In situ cooling down to 77 K (Gatan 914 Cryo holder)
Magnetic imaging resolution 2.2 nm
Precession electron diffraction (DigiStar)
Automatic crystal orientation and phase mapping (ASTAR)
3D diffraction tomography (ADT3D)
Fully-equipped sample preparation facilities
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CAMECA SXFive Electron Microprobe (EPMA)image of CAMECA SXFive Electron Microprobe (EPMA)
LaB6 source
Up to 30kV accelerating voltage
Up to 1uA beam current
Beam current stability within 0.2% per hour (20kV, 10nA)
Beam diameter of 100nm (20kV, 10nA)
Analytical resolution of 0.5um (10kV, 100nA)
Trace element detection limits <0.01wt%
5 vertical WDS spectrometers
Large-area, high-sensitivity diffracting crystals (LPET, LTAP. LLIF, LPC0)
Analyze elements B-U
Integrated zoom optical microscope with reflected, transmitted and polarized light
Stage reproducibility within 1um
Backscatter electron detector (<0.1Z resolution)
Secondary electron detector
Stage and beam mapping
Line profiles
Quantitative and qualitative point and area analyses
Thermo Scientific UltraDry 10mm2 energy dispersive x-ray spectrometer
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FEI Teneo Field Emission Scanning Electron Microscope (FESEM)
Image of FEI Teneo Field Emission Scanning Electron Microscope (FESEM)High vacuum or variable pressure operation
30kV down to 20eV landing energy (with beam deceleration)
Up to 400nA beam current
Everhart-Thornley Secondary Electron Detector
Retractable Directional Backscatter Detector (annular and segmented)
Low Vacuum Secondary Electron Detector
In-lens Annular Backscatter Detector
In-column Secondary Electron Detector
Retractable STEM detector (bright field, dark field and HAADF, holds six samples)
Plasma Cleaner
Chamberscope
Navigational Camera
Large area image mapping and stitching
Oxford Instruments 80mm2 Energy+ (EDS)
Oxford Instruments AZtecHKL (EBSD)
Nabity NPGS electron beam lithography
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image of Hitachi S-3400N-II Analytical Scanning Electron Microscope (SEM)Hitachi S-3400N-II Analytical Scanning Electron Microscope (SEM)
Resolution 3 nm (SEI) and 4 nm (BSI)
Variable Pressure
Oxford Instruments Energy+ (EDS), resolution ≤ 136 eV at MnKa FWHM
Oxford Instruments INCAWave (WDS), resolution ≤ 10 eV
Oxford Instruments AZtecHKL (EBSD)
Samples up to 20 cm in diameter by 11 cm high
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image of Bruker AXS D8 Discover X-Ray Diffractometer
Bruker AXS D8 Discover X-Ray Diffractometer
For high-resolution determination of crystallographic structure, phase composition, and texture at ambient and high temperatures, this instrument includes:
Nickel filter
Göbel Mirror and Germanium primary monochromator
Non-ambient temperature stages (-180°C to 1600°C)
NaI(Tl) scintillation detector
Hi-Star area detector
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image of Rigaku Miniflex 600 bench-top X-ray diffractometerRigaku Miniflex 600 bench-top X-ray diffractometer
600W generator
One dimensional D/teX Ultra high-speed detector (very quick scans)
Scintillating point detector with graphite monochromator (best for resolution)
Multiple-sample loading capability
Zero-loss holders
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image of Bruker Tracer III SD hand-held XRF
Bruker Tracer III SD hand-held XRF
Peltier-cooled 10 mm2 SDD
Typical resolution: 145 eV at 100,000 cps
Vacuum pump attachment for enhanced light-element sensitivity
Gas-flow chamber for the measurement of gases down to Ne
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Leica DM6000 M Materials Microscope
Fully motorized stage, objective and turrets
Bright field, dark field and DIC modes
5 mega pixel digital image acquisition
LAS Montage MultiFocus module – Auto Z-stack image capture
LAS Power Mosaic module – Seamless mosaic image creation
Leica Map module – Surface geometry and texture analysis
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