The Campbell Research Group laboratory is located in MEC 105B/107/108, on the first floor of the Micron Engineering Complex. Our research investigates the materials design of memristors and their operational mechanisms, as well as optically gated transistor and quantum memory bit design.
Our lab maintains a diverse array of device electrical characterization and materials characterization equipment, including high frequency, magnetic field variable, and low temperature microprobe electrical characterization microprobe stations, a Renishaw microRaman instrument, Atomic Force Microscope, n&k film thickness metrology tool, modulated differential scanning calorimeter, electron paramagnetic resonance spectrometer (Bruker ESP300), and a Leica confocal microscope.
Click on the link below for detailed descriptions:
Two General Device Probe Stations
The Lakeshore CRX-4K, Cryogenic Closed Cycle High Frequency Dual Optical/Electrical Probe Station
The Lakeshore EMPX-HF, Magnetic Cryogenic High Frequency Electrical Probe Station System
TA Instruments Q2000 Modulated Differential Scanning Calorimeter
n&k Technologies 1280 Broadband UV-Vis Spectrometer
Atomic Force Microscope (AFM)
Renishaw In Via Raman Confocal Microscope
Electron Paramagnetic Resonance (EPR)
Leica DM2500 Compound Microscope