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AFM – Atomic Force Microscope

AFM Main Image

AFM Building Instructions (pdf)
AFM Parts List (xls)
Ordering Instructions (doc)
AFM Lego Digital Designer File (lxf)

AFM Interaction

The basics of the interaction between scanning probe, sample, and detection mechanism (4 Quadrant Photodetector). Image is courtesy of the University of Wisconsin-Madison Materials Research Science and Engineering Center.

AFM Overview:

  • High-Resolution form of Scanning Probe Microscopy
    • Nanometer resolution in x, y dimensions
    • Angstrom resolution in z dimension
  • Can be used to probe surface roughness and characterize samples physically and chemically
  • Suitable for organic and inorganic substances using various scanning modes

Further Information:


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